Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2009-07-23
2011-10-04
Everhart, Caridad (Department: 2895)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S419000, C438S405000, C257SE21546, C257SE21115
Reexamination Certificate
active
08030148
ABSTRACT:
In a strained SOI semiconductor layer, the stress relaxation which may typically occur during the patterning of trench isolation structures may be reduced by selecting an appropriate reduced target height of the active regions, thereby enabling the formation of transistor elements on the active region of reduced height, which may still include a significant amount of the initial strain component. The active regions of reduced height may be advantageously used for forming fully depleted field effect transistors.
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Beyer Sven
Hoentschel Jan
Wei Andy
Advanced Micro Devices , Inc.
Everhart Caridad
Williams Morgan & Amerson P.C.
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