Static information storage and retrieval – Read/write circuit – Flip-flop used for sensing
Reexamination Certificate
2006-04-18
2006-04-18
Le, Thong Q. (Department: 2827)
Static information storage and retrieval
Read/write circuit
Flip-flop used for sensing
C365S190000
Reexamination Certificate
active
07031213
ABSTRACT:
Provided is a semiconductor memory device using a VSS or VDD bit line precharge approach without a reference cell. Two P-type sense amplifiers are used in the VSS precharge approach and two N-type sense amplifiers are used in the VDD precharge approach. In one of the two sense amplifiers, a transistor that drives a bit line has a lower current driving capability than that of the other transistor that drives a complementary bit line. In the other of the two sense amplifiers, a transistor that drives the complementary bit line has a lower current driving capability than that of the other transistor that drives the bit line. Accordingly, one of the two sense amplifiers first operates and the other of the two sense amplifiers operates after a predetermined delay time according to a position of one of two memory cells, which is selected when a word line is enabled, so as to properly sense data “0” and “1”, thereby solving the problems of the conventional VSS or VDD precharge approach using the reference cell.
REFERENCES:
patent: 5323345 (1994-06-01), Ohsawa
patent: 5761123 (1998-06-01), Kim et al.
patent: 6144603 (2000-11-01), Makino
patent: 6212110 (2001-04-01), Sakamoto et al.
patent: 6570799 (2003-05-01), Parris
Le Thong Q.
Mills & Onello LLP
Samsung Electronics Co,. Ltd.
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