4. Static information storage and retrieval
  5. Read/write circuit
  6. Bad bit

Kyong-jun Noh

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Redundancy circuit capable of disabling use of redundant...

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Redundancy method capable of disabling and replacing...

Static information storage and retrieval – Read/write circuit – Bad bit
Reexamination Certificate

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Semiconductor memory device using VSS or VDD bit line...

Static information storage and retrieval – Read/write circuit – Flip-flop used for sensing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2125824

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