4. Electronic digital logic circuitry
  5. Interface
  6. Current driving

Moo-Sung Chae

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Semiconductor device and method of outputting data therein

Electronic digital logic circuitry – Interface – Current driving
Reexamination Certificate

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Semiconductor memory device and test pattern data generating...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2566579

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