Semiconductor memory device and test method thereof

Details Semiconductor memory device and test method thereof Semiconductor memory device and test method thereof

2008-02-22

2011-10-11

Ho, Hoai V (Department: 2827)

Static information storage and retrieval

Read/write circuit

Testing

Reexamination Certificate

active

08036052

ABSTRACT:
Example embodiments disclose a semiconductor memory device and a test method thereof. The semiconductor memory device includes a memory cell array that provides first and second data groups at a first data rate and an output circuit, in a normal mode of operation, serially outputs the first and second data groups at a first data rate on an external terminal. In a test mode of operation, the output circuit outputs the first data group or the second data group at a second data rate on the external terminal in response to control signals, without switching the test mode. The second data rate may be lower than the first data rate.

REFERENCES:
patent: 7546497 (2009-06-01), Jang
patent: 2004/0246801 (2004-12-01), Lee et al.
patent: 20020080088 (2002-10-01), None
patent: 1020030056117 (2003-07-01), None
patent: 1020040093801 (2004-11-01), None
patent: 1020040104903 (2004-12-01), None
patent: 1020060015208 (2006-02-01), None
patent: 1020060121523 (2006-11-01), None
Korean Office Action dated Feb. 21, 2008 for corresponding Korean Application KR 10-2007-0018053.
Korean Notice of Allowance dated May 26, 2009 for corresponding Korean Patent Application No. 10-2007-0018053.

Affiliated with

Also associated with

Rating

Semiconductor memory device and test method thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor memory device and test method thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor memory device and test method thereof will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-4266291