4. Miscellaneous active electrical nonlinear devices, circuits, and
  5. Signal converting, shaping, or generating
  6. Synchronizing

Hyong-yong Lee

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Device for measuring supply voltage and method thereof

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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Semiconductor memory device and test method thereof

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device capable of performing...

Static information storage and retrieval – Read/write circuit – Testing
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Semiconductor memory device which controls sense amplifier...

Static information storage and retrieval – Read/write circuit – Testing
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Synchronous data sampling circuit

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Synchronizing
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Profile ID: LFUS-PAI-P-2032297

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