4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Replacement of memory spare location, portion, or segment

Fumi Kambara

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Delay variation analysis apparatus and delay variation...

Data processing: measuring – calibrating – or testing – Measurement system – Statistical measurement
Reexamination Certificate

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Memory device, memory device read method

Static information storage and retrieval – Addressing – Sync/clocking
Reexamination Certificate

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Semiconductor memory device and semiconductor memory device...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Replacement of memory spare location – portion – or segment
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2342659

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