Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-02-07
2006-02-07
Eckert, George (Department: 2815)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S003000, C438S396000
Reexamination Certificate
active
06995058
ABSTRACT:
The present invention is a high quality semiconductor memory device using a ferroelectric thin film capacitor as a memory capacitor at a high manufacturing yield, the ferroelectric thin film of the capacitor is specified such that the relative standard deviation of crystal grain sizes is 13% or less, to thereby ensure a high remanent polarization value and a small film fatigue (large rewritable number).
REFERENCES:
patent: 5828098 (1998-10-01), Shimada et al.
patent: 5973911 (1999-10-01), Nishioka
patent: 6025205 (2000-02-01), Park et al.
patent: 6143597 (2000-11-01), Matsuda et al.
patent: 6144057 (2000-11-01), Yamazaki
patent: 6239457 (2001-05-01), Suenaga et al.
patent: 6285048 (2001-09-01), Azuma et al.
patent: 6346424 (2002-02-01), Schindler et al.
patent: 6417110 (2002-07-01), Boyer
patent: 6551652 (2003-04-01), Qiu et al.
patent: 6579754 (2003-06-01), Suenaga et al.
patent: 5259389 (1993-10-01), None
patent: 6-151601 (1994-05-01), None
patent: 7-142600 (1995-06-01), None
patent: 10012832 (1996-06-01), None
patent: 9008246 (1997-01-01), None
patent: 09045872 (1997-02-01), None
patent: 09064309 (1997-03-01), None
patent: 9282943 (1997-10-01), None
patent: 10-012832 (1998-01-01), None
“Preparation and Electrical Properties of High Quality PZT Thin Films on RuOx Electrode”, Lee et al., Integrated Ferroelectrics, 1995, vol. 10., pp. 145-154.
“Large-Sized Sample SPM Observation System Operation Guide”, (pub. Tokyo Technica), Apr. 1996.
The Whole of Non-erasable IC Memory RAM (edited by Tomoji Kawai, pub. Kougyou Chousa Kai, 1996), pp. 202-219.
“Ferroelectric Thin Film Memory” (pub. by Science Forum, 1995), pp. 225-229.
Text of Realize Corporation's Advanced Technical Lecture entitled “Advanced Technology of Nonvolatile Ferroelectric Thin Film Memory and Problem Associated with Process Technology (Realize Corporation, 1996)” .
Kazuo Hirata et al., “Pb (Zr, Ti) O3Thin-Film Preparation by Multitarget Magnetron Sputtering”, Jpn. J. Appl. Phys. vol. 31, No. 9B (1992), pp. 3021-3024.
Abe Hisahiko
Horikoshi Kazuhiko
Kato Hisayuki
Ogata Kiyoshi
Suenaga Kazufumi
Antonelli Terry Stout & Kraus LLP
Eckert George
Renesas Technology Corp.
Richards N. Drew
LandOfFree
Semiconductor memory device and manufacturing method thereof does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor memory device and manufacturing method thereof, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor memory device and manufacturing method thereof will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3656403