Static information storage and retrieval – Read/write circuit – Precharge
Reexamination Certificate
2005-09-20
2005-09-20
Phung, Anh (Department: 2824)
Static information storage and retrieval
Read/write circuit
Precharge
C365S198000, C365S230030
Reexamination Certificate
active
06947343
ABSTRACT:
Each memory block of a memory device a plurality of memory cells connected to a plurality of bit line pairs, a column selecting circuit, and a pre-charge and write control circuit. The column selecting circuit includes a plurality of CMOS transmission gates, each CMOS transmission gate including an NMOS transistor connected between one bit line of a bit line pair and a sense bit line of a sense bit line pair, and a PMOS transistor connected between the one bit line and one of the write bit lines of a write bit line pair. During a write operation, only the NMOS transistor of a selected one of the CMOS transmission gates is turned on, and the PMOS transistor of the selected CMOS transmission gate and the PMOS and NMOS transistors of all of the CMOS transmission gates except the selected one are all turned off.
REFERENCES:
patent: 5844849 (1998-12-01), Furutani
patent: 5864511 (1999-01-01), Sato
patent: 6172918 (2001-01-01), Hidaka
Le Toan
Phung Anh
Samsung Electronics Co,. Ltd.
Volentine Francos & Whitt PLLC
LandOfFree
Semiconductor memory device does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor memory device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor memory device will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3406889