Semiconductor integrated circuit having a number of data...

Details Semiconductor integrated circuit having a number of data... Semiconductor integrated circuit having a number of data...

2008-01-22

2008-01-22

Britt, Cynthia (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S027000, C714S030000, C714S734000

Reexamination Certificate

active

07321998

ABSTRACT:
A semiconductor integrated circuit includes a plurality of data output pins, a data processing circuit to generate output signals responsive to an input signal, and an output selection circuit with at least a normal mode and a test mode. A first group of output signals are provided to a first group of data output pins in a first test cycle of the test mode. And a second group of output signals are provided to a second group of data output pins during a second test cycle of the test mode. The semiconductor integrated circuit can be tested by means of a test device having less test pins than the output pins of the semiconductor integrated circuit under test.

REFERENCES:
patent: 4348759 (1982-09-01), Schnurmann
patent: 4357703 (1982-11-01), Van Brunt
patent: 4724379 (1988-02-01), Hoffman
patent: 5025205 (1991-06-01), Mydill et al.
patent: 5315241 (1994-05-01), Ewers
patent: 5457380 (1995-10-01), Blumenau
patent: 5506510 (1996-04-01), Blumenau
patent: 5712858 (1998-01-01), Godiwala et al.
patent: 5909450 (1999-06-01), Wright
patent: 6971045 (2005-11-01), Deb et al.
patent: 2001/0044918 (2001-11-01), Sato et al.
patent: 2005/0166113 (2005-07-01), Ozawa

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