Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2011-06-14
2011-06-14
Smith, Zandra (Department: 2822)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257SE27060, C257SE29256
Reexamination Certificate
active
07960785
ABSTRACT:
A semiconductor integrated circuit device may include: a substrate that includes a high-voltage device region and a low-voltage device region defined on the substrate; a first buried impurity layer formed in at least a portion of the high-voltage device region and coupled to a first voltage; a second buried impurity layer formed in at least a portion of the low-voltage device region and coupled to a second voltage less than the first voltage; and a well formed on the second buried impurity layer in the low-voltage device region and coupled to a third voltage less than the second voltage.
REFERENCES:
patent: 6376891 (2002-04-01), Nagatani et al.
patent: 2005-038962 (2005-02-01), None
patent: 2005-303138 (2005-10-01), None
patent: 10-2007-0069552 (2007-07-01), None
Kim Joung-Ho
Kim Yong-Chan
Kim Yong-Don
Lee Eung-Kyu
Lee Mueng-Ryul
Harness & Dickey & Pierce P.L.C.
Patton Paul E
Samsung Electronics Co,. Ltd.
Smith Zandra
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