Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Patent
1997-06-23
1999-08-31
Chang, Joni
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
438649, H01L 218234
Patent
active
059465654
ABSTRACT:
A SRAM of complete CMOS type having its memory cell composed of six MISFETs, in which a pair of local wiring lines for connecting the input/output terminals of CMOS inverters are formed of a refractory metal silicide layer formed over a first conducting layer constituting the individual gate electrodes of the drive MISFETs, the transfer MISFETs and the load MISFETs of the memory cell and in which a reference voltage line formed over the local wiring lines is arranged to be superposed over the local wiring lines to form a capacity element. Moreover, the capacity element is formed between the local wiring lines and the first conducting layer by superposing the local wiring lines over the first conducting layer. Moreover, the local wiring lines are formed by using resistance lowering means such as silicification. In addition, there are made common the means for lowering the resistance of the gate electrode of the transfer MISFETs and the means for forming the local wiring lines.
REFERENCES:
patent: 5656524 (1997-08-01), Eklund et al.
patent: 5716871 (1998-02-01), Yamazaki et al.
Fukami Akira
Iida Masaya
Ikeda Shuji
Kikushima Ken'ichi
Mitani Shinichiro
Chang Joni
Hitachi , Ltd.
Hitachi ULSI Engineering Co., Ltd.
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