4. Static information storage and retrieval
  5. Addressing
  6. Sync/clocking

Yoshio Takazawa

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Semiconductor integrated circuit and IC card

Static information storage and retrieval – Addressing – Sync/clocking
Reexamination Certificate

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Semiconductor integrated circuit and IC card

Static information storage and retrieval – Powering – Data preservation
Reexamination Certificate

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Semiconductor integrated circuit and IC card

Static information storage and retrieval – Powering – Data preservation
Reexamination Certificate

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Semiconductor integrated circuit and testing method thereof

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Semiconductor integrated circuit and testing method thereof

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2424268

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