Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-12-20
2009-06-09
Nguyen, Tu T (Department: 4126)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
Reexamination Certificate
active
07544565
ABSTRACT:
Methods of forming a semiconductor device include forming a trench mask pattern on a semiconductor substrate having active regions and device isolation regions. A thermal oxidation process is performed using the trench mask pattern as a diffusion mask to form a thermal oxide layer defining a convex upper surface of the active regions. The thermal oxide layer and the semiconductor substrate are etched using the trench mask pattern as an etch mask to form trenches defining convex upper surfaces of the active regions. The trench mask pattern is removed to expose the convex upper surfaces of the active regions. Gate patterns are formed extending over the active regions.
REFERENCES:
patent: 6777741 (2004-08-01), Rabkin et al.
patent: 6989303 (2006-01-01), Mori
patent: 05-299497 (1993-11-01), None
patent: 10-022403 (1998-01-01), None
patent: 2002-033476 (2002-01-01), None
patent: 1020000001034 (2000-01-01), None
patent: 1020000048421 (2000-07-01), None
patent: 1020050039627 (2005-04-01), None
patent: 1020050101668 (2005-10-01), None
patent: 1020060019470 (2006-03-01), None
Jeong Won-Cheol
Kwak Dong-Hwa
Park Jae-Kwan
Sim Jae-Hwang
Yim Yong-Sik
Choudhry Mohammad M
Myers Bigel & Sibley & Sajovec
Nguyen Tu T
Samsung Electronics Co,. Ltd.
LandOfFree
Semiconductor devices having a convex active region and... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Semiconductor devices having a convex active region and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor devices having a convex active region and... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4055455