4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Hiroki Dembo

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Clock signal generation circuit and semiconductor device

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Clock or pulse waveform generating
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Radio field intensity measurement device, and radio field...

Communications: electrical – Condition responsive indicating system – Specific condition
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Semiconductor device

Communications: electrical – Selective – Interrogation response
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Semiconductor device

Registers – Systems controlled by data bearing records
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Semiconductor device and inspection method of semiconductor...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Memory testing
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Profile ID: LFUS-PAI-P-2263915

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