Semiconductor apparatus and method for fabricating the same

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S259000, C257S330000, C257SE21384, C257SE21419, C257SE21428

Reexamination Certificate

active

07829418

ABSTRACT:
A semiconductor apparatus including a trench gate transistor having at least an active region surrounded by a device isolation insulating film; a trench provided by bringing both ends thereof into contact with the device isolation insulating film in the active region; a gate electrode formed in the trench via a gate insulating film; and a diffusion layer formed close to the trench; on a semiconductor substrate, and also includes an opening portion positioned on one surface of the semiconductor substrate; a pair of first inner walls positioned in a side of the device isolation insulating film and connected with the opening portion; a pair of second inner walls positioned in a side of the active region and connected with the opening portion; and a bottom portion positioned opposite to the opening portion and connected with the first inner walls and the second inner walls, wherein a cross sectional outline of the second inner wall is substantially linear, and a burr generated inside the trench is removed or reduced.

REFERENCES:
patent: 6448139 (2002-09-01), Ito et al.
patent: 7531414 (2009-05-01), Park et al.
patent: 2002/0106892 (2002-08-01), Shibata et al.
patent: 2005/0001252 (2005-01-01), Kim et al.
patent: 2005/0001266 (2005-01-01), Kim
patent: 2005/0106794 (2005-05-01), Kuribayashi et al.
patent: 2007/0004128 (2007-01-01), Jung
patent: 2008/0199995 (2008-08-01), Woolsey et al.
patent: 2009/0045411 (2009-02-01), Lin et al.
patent: 2001-351895 (2001-12-01), None
patent: 2003-229479 (2003-08-01), None
patent: 2004-140039 (2004-05-01), None
patent: 2005-79215 (2005-03-01), None
patent: 2005-142265 (2005-06-01), None
Chinese Office Action dated Dec. 4, 2009 and English translation thereof.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor apparatus and method for fabricating the same does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor apparatus and method for fabricating the same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor apparatus and method for fabricating the same will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4191986

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.