Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2011-04-19
2011-04-19
Petranek, Jacob (Department: 2183)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S724000
Reexamination Certificate
active
07930606
ABSTRACT:
A semiconductor integrated circuit (chip) includes a primary TAP controller and a secondary TAP controller. The primary TAP controller interprets a bit string of n bits included in the group 1 having an m-bit length (m≧2) and less than the total number of m bits as an instruction that carries out a processing for a control object and interprets each bit string having an m-bit length as an instruction that carries out no processing for the control object. The m-bit length is obtained by adding a predetermined single bit string to each bit string included in the group 1 consisting of at least two or more bit strings having an n-bit length, respectively. The secondary TAP controller extracts a single bit string denoting an instruction that has an n-bit length and carries out no processing for the control object from each bit string interpreted by the primary TAP controller as an instruction that carries out a processing for the control object, then interprets the single bit string.
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Kunie Shuichi
Machimura Hiroki
McGinn IP Law Group PLLC
Petranek Jacob
Renesas Electronics Corporation
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