Selectively debugging processor cores through instruction codes

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

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C714S724000

Reexamination Certificate

active

07930606

ABSTRACT:
A semiconductor integrated circuit (chip) includes a primary TAP controller and a secondary TAP controller. The primary TAP controller interprets a bit string of n bits included in the group 1 having an m-bit length (m≧2) and less than the total number of m bits as an instruction that carries out a processing for a control object and interprets each bit string having an m-bit length as an instruction that carries out no processing for the control object. The m-bit length is obtained by adding a predetermined single bit string to each bit string included in the group 1 consisting of at least two or more bit strings having an n-bit length, respectively. The secondary TAP controller extracts a single bit string denoting an instruction that has an n-bit length and carries out no processing for the control object from each bit string interpreted by the primary TAP controller as an instruction that carries out a processing for the control object, then interprets the single bit string.

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patent: 6829730 (2004-12-01), Nadeau-Dostie et al.
patent: 7665002 (2010-02-01), White et al.
patent: 2005/0257108 (2005-11-01), Grupp et al.
patent: 2007/0226558 (2007-09-01), Ikeda et al.
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patent: 2004-164367 (2004-06-01), None
patent: WO 02/088945 (2002-11-01), None
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European Search Report dated Dec. 22, 2008.

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