Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Patent
1996-06-07
1999-02-02
Chang, Ceila
Semiconductor device manufacturing: process
Chemical etching
Combined with coating step
438756, H01L 2100
Patent
active
058664815
ABSTRACT:
This invention relates to a method for protecting regions of a spin-on-glass(SOG) layer, which covers usable semiconductor dice, from dissolution damage during an etch step which removes SOG along the wafer edge. The endangered dice have portions which lie in the area affected by the edge rinse. Instead of performing the edge etching step immediately after the deposition of the SOG, the endangered dice are first selectively partially cured by exposure to ultraviolet radiation. This makes the SOG over these dice resistant to the SOG solvent used for the edge rinse. Up to ten percent of the total usable dice on the wafer can be salvaged by the method of this invention.
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Hsu Sung-Mu
Tsai Chia-Shiung
Tseng Pin-Nan
Ackerman Stephen B.
Chang Ceila
Saile George O.
Taiwan Semiconductor Manufacturing Company , Ltd.
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