Segmented algorithmic pattern generator

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C714S738000, C714S032000

Reexamination Certificate

active

10710802

ABSTRACT:
A segmented algorithmic pattern generator engine producing a test signal pattern made of vectors divided into fully definable segments. The engine allows defining processing controls to allow offsets of individual vectors relative to one another and defining additional pattern control formats. Also provided are reducing the pattern format depths in defining counter dimensions within each segment. Single vectors or vector group sequences may be defined at any point as well. The system allows the user control of the pattern generator to compensate for tool and/or device under test latency timing issues. Inputs may be combined and processed into one contiguous pattern of vectors which are definable by the user.

REFERENCES:
patent: 4994732 (1991-02-01), Jeffrey et al.
patent: 5010552 (1991-04-01), Dias et al.
patent: 5097468 (1992-03-01), Earlie
patent: 5430736 (1995-07-01), Takeoka et al.
patent: 5802075 (1998-09-01), Carpenter et al.
patent: 5862149 (1999-01-01), Carpenter et al.
patent: 5872797 (1999-02-01), Theodoseau
patent: 6044480 (2000-03-01), Keen
patent: 6092225 (2000-07-01), Gruodis et al.
patent: 6212667 (2001-04-01), Geer et al.
patent: 6314540 (2001-11-01), Huott et al.
patent: 6615380 (2003-09-01), Kapur et al.
patent: 2-24584 (1990-01-01), None
patent: 2001-349930 (2001-12-01), None
C.W. Cha, et al., “Array Test Pattern Generation Algorithms for a Per Pin Tester”, IBM Technical Disclosure Bulletin, vol. 30, No. 10, Mar. 1988.
J.T. Muhr, et al., “Test Pattern Generation for Partitioned Programmable Logic Arrays”, IBM Technical Disclosure Bulletin, vol. 26, No. 3B, Aug. 1983.
P.Y.W. Au, et al., “Technique for VLSI In-Circuit Testing”, IBM Technical Disclosure Bulletin, vol. 31, No. 4, Sep. 1988.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Segmented algorithmic pattern generator does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Segmented algorithmic pattern generator, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Segmented algorithmic pattern generator will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3902729

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.