Scan testing methods

Details Scan testing methods Scan testing methods

2011-01-11

2011-01-11

Ton, David (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S727000, C714S729000

Reexamination Certificate

active

07870452

ABSTRACT:
A method of testing an integrated circuit, comprises providing a test vector to a shift register arrangement by providing test vector bits in series into the shift register arrangement (20) timed with a first, scan, clock signal (42). The test vector bits are passed between adjacent portions of the shift register arrangement timed with the first clock signal (42) and an output response of the integrated circuit to the test vector is provided and analyzed. The output response of the integrated circuit to the test vector is provided under the control of a second clock signal (56) which is slower than the first clock signal. This testing method speeds up the process by increasing the speed of shifting test vectors and results into and out of the shift register, but without comprising the stability of the testing process. Furthermore, the method can be implemented without requiring additional complexity of the testing circuitry to be integrated onto the circuit substrate.

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patent: 0201719 (2002-01-01), None

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