Scan path circuit permitting transition between first and second

Details Scan path circuit permitting transition between first and second Scan path circuit permitting transition between first and second

1997-12-02

1999-08-10

Nguyen, Hoa T.

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

G01R 3128

Patent

active

059352655

ABSTRACT:
Logical device comprises a combinational circuit and a sequential circuit. The sequential circuit has a holding means which is between the combinational circuit and flip-flops of the sequential circuit. The output data of the holding means are not changed until a control signal is applied to a control terminal. The performance of the combinational circuit in the logical device can be checked.

REFERENCES:
patent: 4225958 (1980-09-01), Funatsu

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