4. Error detection/correction and fault detection/recovery
  5. Pulse or data error handling
  6. Digital logic testing

Hajime Nagai

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Scan path circuit permitting transition between first and second

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Patent

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Voltage converter apparatus

Electronic digital logic circuitry – Interface – Logic level shifting
Reexamination Certificate

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Profile ID: LFUS-PAI-P-1247174

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