Scan method for built-in-self-repair (BISR)

Details Scan method for built-in-self-repair (BISR) Scan method for built-in-self-repair (BISR)

2005-08-09

2005-08-09

Lamarre, Guy J. (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

Reexamination Certificate

active

06928598

ABSTRACT:
A system and method for protecting the values stored in a BISR repair block and, optionally, debugging the BISR repair logic without altering normal test flow is implemented by a circuit including a plurality of soft latches within the BISR repair block, the soft latches being coupled together to form a BISR scan chain for holding BISR repair information. A chip level scan enable signal and a scan hold control signal cooperate to control connection of the BISR scan chain to other scan chains during a scan test, so that the BSR repair information is held within the soft latches. A diagnose enable signal cooperating with the chip level scan enable signal and the scan hold control signal for enabling debugging of logic connecting the BISR scan chains.

REFERENCES:
patent: 6067262 (2000-05-01), Irrinki et al.
patent: 6212656 (2001-04-01), Fosco et al.
patent: 6408414 (2002-06-01), Hatada

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