Scan control method, scan control circuit and apparatus

Details Scan control method, scan control circuit and apparatus Scan control method, scan control circuit and apparatus

2009-03-03

2011-10-04

Ton, David (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S729000

Reexamination Certificate

active

08032807

ABSTRACT:
A scan control method for a circuit device connected with a first bus and having a test access port controller, including setting information indicating a register to be scanned in the circuit device, a number of scan shifts and a scan start via a second bus different from the first bus, and generating based on the information set, by using a sequencer, a signal replacing a test mode signal and a test reset signal transferred via the first bus during testing of the circuit device, and supplying the signal to the test access port controller.

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European Search Report mailed Jul. 10, 2009 and issued in corresponding European Patent Application 09154439.5.

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