Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2006-04-25
2009-08-25
Britt, Cynthia (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
C714S729000
Reexamination Certificate
active
07581149
ABSTRACT:
A scan-chain extracting method of the present invention includes a defining step of defining control-circuit scan chains provided in a test control circuit; an initial-value setting step of setting an initial value for the sequence circuit devices of the control-circuit scan chains; a state setting step of setting the scan chains to through states; an extracting step of extracting data regarding the scan chains; a determining step of determining whether or not data regarding all the scan chains have been extracted; and a changing step of changing the initial value for the sequence circuit devices included in the test control circuit connected to the sequence circuit devices located at the start points of the scan chains, when it is determined that not all data regarding the scan chains have been extracted.
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Britt Cynthia
Fujitsu Limited
Staas & Halsey , LLP
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