Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-09-14
2008-12-16
Kik, Phallaka (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C703S016000
Reexamination Certificate
active
07467365
ABSTRACT:
This invention discloses a method for sanity checking integrated circuit (IC) designs based on one or more predefined sub-circuits with at least one predefined checking criteria, the method comprising automatically reading one or more netlists, identifying one or more sub-circuits in the netlists isomorphic to at least one of predefined sub-circuits, identifying one or more device parameters for sanity checking the identified sub-circuits, and comparing the identified device parameters against the predefined checking criteria.
REFERENCES:
patent: 5956497 (1999-09-01), Ratzel et al.
patent: 6473881 (2002-10-01), Lehner et al.
patent: 6577992 (2003-06-01), Tcherniaev et al.
patent: 2001/0013791 (2001-08-01), Van Lammeren et al.
patent: 2003/0115035 (2003-06-01), Kulshreshtha et al.
patent: 2004/0168143 (2004-08-01), Kishibe
patent: 2006/0112356 (2006-05-01), McGaughy et al.
patent: 2007/0006109 (2007-01-01), Bartling et al.
patent: 2007/0150843 (2007-06-01), Su et al.
patent: 2007/0192752 (2007-08-01), Bhattacharya et al.
Chang George H.
Cheng Yi-Kan
Fan Chen-Teng
Hou Yung-Chin
Wang Chu-Ping James
K & L Gates LLP
Kik Phallaka
Taiwan Semiconductor Manufacturing Co.
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