4. Miscellaneous active electrical nonlinear devices, circuits, and
  5. Signal converting, shaping, or generating
  6. Clock or pulse waveform generating

Chen-Teng Fan

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Chip capacitance measurement circuit

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate

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I/O circuit placement method and semiconductor device

Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
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Memory test system for peak power reduction

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
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Mux scan cell with delay circuit for reducing hold-time...

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Programmable clock trunk architecture

Miscellaneous active electrical nonlinear devices – circuits – and – Signal converting – shaping – or generating – Clock or pulse waveform generating
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Profile ID: LFUS-PAI-P-2467283

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