Retractable pin dual in-line package test clip

Details Retractable pin dual in-line package test clip Retractable pin dual in-line package test clip

1993-12-07

1996-06-11

Mintel, William

Active solid-state devices (e.g., transistors, solid-state diode

Test or calibration structure

257678, 29749, 29758, 422 56, H01L 2358

Patent

active

055258123

ABSTRACT:
This invention is a Dual In-Line Package (DIP) test clip for use when troubleshooting circuits containing DIP integrated circuits. This test clip is a significant improvement over existing DIP test clips in that it has retractable pins which will permit troubleshooting without risk of accidentally shorting adjacent pins together when moving probes to different pins on energized circuits or when the probe is accidentally bumped while taking measurements.

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patent: 4543624 (1985-09-01), Rumble
patent: 4618208 (1986-10-01), Igarashi
patent: 4749362 (1988-06-01), Hoffman et al.
patent: 4777445 (1988-10-01), Kahl
patent: 4981441 (1991-01-01), Ignasiak
patent: 5124646 (1992-06-01), Shiraishi

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