Reducing poly-depletion through co-implanting carbon and...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S232000, C438S305000, C438S585000, C438S587000, C438S592000

Reexamination Certificate

active

07736968

ABSTRACT:
A method for forming a semiconductor structure includes providing a semiconductor substrate; forming a gate dielectric layer over the semiconductor substrate; forming a gate electrode layer over the gate dielectric layer; doping carbon and nitrogen into the gate electrode layer; and, after the step of doping carbon and nitrogen, patterning the gate dielectric layer and the gate electrode layer to form a gate dielectric and a gate electrode, respectively.

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patent: 7498642 (2009-03-01), Chen et al.
patent: 2006/0084217 (2006-04-01), Luo et al.

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