Rare earth metal oxide memory element based on charge...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S197000

Reexamination Certificate

active

07078301

ABSTRACT:
A data storage element (and method of forming the same) includes a substrate comprising a semiconductor material, a metal oxide layer including an electrically insulating rare earth metal oxide disposed upon a surface of the substrate, a conductive material disposed upon the metal oxide layer, a first electrode electrically connected to the conductive material, and a second electrode connected to the substrate.

REFERENCES:
patent: 6504214 (2003-01-01), Yu et al.
patent: 6541280 (2003-04-01), Kaushik et al.
patent: 6548855 (2003-04-01), Ramsbey et al.
patent: 6753567 (2004-06-01), Maria et al.
patent: 2002/0115252 (2002-08-01), Haukka et al.
patent: 2002/0137317 (2002-09-01), Kaushik et al.
patent: 2002/0142536 (2002-10-01), Zhang et al.
patent: 2002/0151142 (2002-10-01), Callegari et al.
patent: 2002/0164850 (2002-11-01), Gnadinger et al.
patent: 2003/0060018 (2003-03-01), Hsu
patent: 2003/0124871 (2003-07-01), Arghavani et al.
patent: 2003/0136331 (2003-07-01), Ami et al.
U.S. Appl. No. 09/913,723 filed Aug. 17, 2001 entitled “Microelectric Device for Storing Information and Method Thereof.”.
Chon et al. “Fatigue free samarium-modified bismuth titanate film capacitors having large spontaneous polarizations”, November Applied Physics Letters, vol. 79 No. 10 pp. 3137-3139.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Rare earth metal oxide memory element based on charge... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Rare earth metal oxide memory element based on charge..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Rare earth metal oxide memory element based on charge... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3593141

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.