Programmable built-in self-test circuit for...

Details Programmable built-in self-test circuit for... Programmable built-in self-test circuit for...

2007-09-25

2007-09-25

Lamarre, Guy (Department: 2138)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital logic testing

C714S716000, C714S734000, C714S739000, C714S704000, C714S715000, C714S738000, C714S712000, C375S224000, C370S249000

Reexamination Certificate

active

10678511

ABSTRACT:
A built-in self-test circuit for use in testing a serializer/deserializer circuit includes a programmable transmit register that transmits data to the serializer/deserializer circuit having programmably varying characteristics. The built-in self-test circuit includes the transmit register that transmits data to the serializer/deserializer for processing into processed data, a receive register that receives the processed data from the serializer/deserializer, and an error detector that detects errors in the processed data.

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