Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Patent
1996-03-28
1998-02-10
Tsai, Jey
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
438239, 438253, H01L 218242
Patent
active
057168814
ABSTRACT:
A fabrication process for integrating stacked capacitor, DRAM devices, and thin film transistor, SRAM devices, has been developed. The fabrication process features combining key operations used to create transfer gate transistor structures, and access transistor structures for the DRAM and SRAM devices. In addition, process steps, used to create a capacitor structure, for the DRAM device, and a thin film transistor structure, for the SRAM device, are also shared. Another key feature of this invention is a buried contact structure, used for the SRAM device.
REFERENCES:
patent: 5066602 (1991-11-01), Takemoto et al.
patent: 5187122 (1993-02-01), Bonis
patent: 5340762 (1994-08-01), Vora
patent: 5389568 (1995-02-01), Yun
patent: 5525552 (1996-06-01), Huang
Liang Mong-Song
Su Chung-Hui
Wang Chen-Jong
Wuu Shou-Gwo
Ackerman Stephen B.
Saile George O.
Taiwan Semiconductor Manufacturing Company , Ltd.
Tsai Jey
LandOfFree
Process to fabricate stacked capacitor DRAM and low power thin f does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Process to fabricate stacked capacitor DRAM and low power thin f, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process to fabricate stacked capacitor DRAM and low power thin f will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2076880