Cleaning and liquid contact with solids – Processes – Using sequentially applied treating agents
Reexamination Certificate
2011-05-10
2011-05-10
Kornakov, Michael (Department: 1714)
Cleaning and liquid contact with solids
Processes
Using sequentially applied treating agents
C134S026000, C134S027000, C134S029000, C134S002000, C134S003000
Reexamination Certificate
active
07938911
ABSTRACT:
Semiconductor wafers are cleaned using a cleaning solution containing an alkaline ammonium component in an initial composition, wherein the semiconductor wafer is brought into contact with the cleaning solution in an individual-wafer treatment, and in the course of cleaning hydrogen fluoride is added as further component to the cleaning solution, and the cleaning solution has at the end of cleaning, a composition that differs from the initial composition.
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Buschhardt Thomas
Feijoo Diego
Schwab Guenter
Zapilko Clemens
Brooks & Kushman P.C.
Kornakov Michael
Siltronic AG
Whatley Katelyn B
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