Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into... – Plasma
Reexamination Certificate
2007-08-14
2007-08-14
Nhu, David (Department: 2818)
Semiconductor device manufacturing: process
Introduction of conductivity modifying dopant into...
Plasma
C438S474000, C438S475000, C438S678000, C438S680000, C257SE21170, C257SE21218, C257SE21229, C257SE21319
Reexamination Certificate
active
10934850
ABSTRACT:
Embodiments of the present invention relate to an apparatus and method of annealing substrates in a thermal anneal chamber and/or a plasma anneal chamber before electroless deposition thereover. In one embodiment, annealing in a thermal anneal chamber includes heating the substrate in a vacuum environment while providing a gas, such as noble gases, hydrogen gas, other reducing gases, nitrogen gas, other non-reactive gases, and combinations thereof. In another embodiment, annealing in a plasma chamber comprises plasma annealing the substrate in a plasma, such as a plasma from an argon gas, helium gas, hydrogen gas, and combinations thereof.
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Emami Ramin
Fang Hongbin
Lopatin Sergey
Shanmugasundram Arulkumar
Applied Materials Inc.
Nhu David
Patterson & Sheridan LLP
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