Pretreatment for electroless deposition

Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into... – Plasma

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S474000, C438S475000, C438S678000, C438S680000, C257SE21170, C257SE21218, C257SE21229, C257SE21319

Reexamination Certificate

active

10934850

ABSTRACT:
Embodiments of the present invention relate to an apparatus and method of annealing substrates in a thermal anneal chamber and/or a plasma anneal chamber before electroless deposition thereover. In one embodiment, annealing in a thermal anneal chamber includes heating the substrate in a vacuum environment while providing a gas, such as noble gases, hydrogen gas, other reducing gases, nitrogen gas, other non-reactive gases, and combinations thereof. In another embodiment, annealing in a plasma chamber comprises plasma annealing the substrate in a plasma, such as a plasma from an argon gas, helium gas, hydrogen gas, and combinations thereof.

REFERENCES:
patent: 3403035 (1968-09-01), Schneble et al.
patent: 3745039 (1973-07-01), Feldstein et al.
patent: 4717591 (1988-01-01), Acosta et al.
patent: 5169680 (1992-12-01), Ting et al.
patent: 5380560 (1995-01-01), Kaja et al.
patent: 5674787 (1997-10-01), Zhao et al.
patent: 5695810 (1997-12-01), Dubin et al.
patent: 5755859 (1998-05-01), Brusic et al.
patent: 5824599 (1998-10-01), Shacham-Diamand et al.
patent: 5830805 (1998-11-01), Shacham-Diamand et al.
patent: 5891513 (1999-04-01), Dubin et al.
patent: 6100184 (2000-08-01), Zhao et al.
patent: 6136163 (2000-10-01), Cheung et al.
patent: 6144099 (2000-11-01), Lopatin et al.
patent: 6165912 (2000-12-01), McConnell et al.
patent: 6187152 (2001-02-01), Ting et al.
patent: 6197364 (2001-03-01), Paunovic et al.
patent: 6258223 (2001-07-01), Cheung et al.
patent: 6261637 (2001-07-01), Oberle
patent: 6291082 (2001-09-01), Lopatin
patent: 6297147 (2001-10-01), Yang et al.
patent: 6342733 (2002-01-01), Hu et al.
patent: 6344410 (2002-02-01), Lopatin et al.
patent: 6365025 (2002-04-01), Ting et al.
patent: 6436267 (2002-08-01), Carl et al.
patent: 6528409 (2003-03-01), Lopatin et al.
patent: 6616967 (2003-09-01), Test
patent: 6645550 (2003-11-01), Cheung et al.
patent: 6645567 (2003-11-01), Chebiam et al.
patent: 6680540 (2004-01-01), Nakano et al.
patent: 6717189 (2004-04-01), Inoue et al.
patent: 6740221 (2004-05-01), Cheung et al.
patent: 6818066 (2004-11-01), Cheung
patent: 6824612 (2004-11-01), Stevens et al.
patent: 6824666 (2004-11-01), Gandikota et al.
patent: 2001/0030366 (2001-10-01), Nakano et al.
patent: 2001/0055934 (2001-12-01), Cheung
patent: 2002/0043466 (2002-04-01), Dordi et al.
patent: 2002/0098681 (2002-07-01), Hu et al.
patent: 2002/0098711 (2002-07-01), Klein
patent: 2002/0152955 (2002-10-01), Dordi et al.
patent: 2003/0010645 (2003-01-01), Ting et al.
patent: 2003/0075808 (2003-04-01), Inoue et al.
patent: 2003/0113576 (2003-06-01), Chebiam et al.
patent: 2003/0118732 (2003-06-01), Stevens et al.
patent: 2003/0127336 (2003-07-01), Cohen et al.
patent: 2003/0139942 (2003-07-01), Rakshit et al.
patent: 2003/0140988 (2003-07-01), Gandikota et al.
patent: 2003/0141018 (2003-07-01), Stevens et al.
patent: 2003/0181040 (2003-09-01), Ivanov et al.
patent: 2003/0189026 (2003-10-01), Padhi et al.
patent: 2003/0190426 (2003-10-01), Padhi et al.
patent: 2003/0190812 (2003-10-01), Padhi et al.
patent: 2003/0194872 (2003-10-01), Parikh et al.
patent: 2003/0235983 (2003-12-01), Li et al.
patent: 2004/0003873 (2004-01-01), Chen et al.
patent: 2004/0035316 (2004-02-01), Chebiam et al.
patent: 2004/0038073 (2004-02-01), Chebiam et al.
patent: 2004/0052963 (2004-03-01), Ivanov et al.
patent: 2004/0065540 (2004-04-01), Mayer et al.
patent: 2004/0084141 (2004-05-01), Czaplicki
patent: 2004/0084143 (2004-05-01), Ivanov et al.
patent: 2004/0094087 (2004-05-01), Ivanov et al.
patent: 2004/0094186 (2004-05-01), Ivanov
patent: 2004/0096592 (2004-05-01), Chebiam et al.
patent: 2004/0097071 (2004-05-01), Ivanov
patent: 2004/0112756 (2004-06-01), Boyd et al.
patent: 2004/0134375 (2004-07-01), Kolics et al.
patent: 2004/0154185 (2004-08-01), Morad et al.
patent: 2004/0175509 (2004-09-01), Kolics et al.
patent: 2004/0201041 (2004-10-01), Madok et al.
patent: 2004/0262772 (2004-12-01), Ramanathan et al.
patent: 2005/0090098 (2005-04-01), Dubin et al.
patent: WO 88/08887 (1988-11-01), None
Chen, et al., US Patent Application “Method and Apparatus For Annealing Copper Films”, U.S. Appl. No. 09/513,734, filed Feb. 18, 2000.
Partial International Search Report dated Apr. 6, 2005 regarding International Application No. PCT/US2004/034044.
Partial International Search Report dated Apr. 6, 2005 regarding International Application No. PCT/US2004/034449.
Dubin, et al.,Selective and Blanket Electroless Copper Deposition for Ultralarge Scale Integration, J Electrochem. Soc., vol. 144, No. 3, Mar. 1997, The Electrochemical Society, Inc., pp. 898-908.
Hu, et al.; “Reduced electromigration of Cu wires by surface coating”, American Institute of Physics, vol. 81, No. 10, Sep. 2, 2002; pp. 1782-1784.
Shacham-Diamand, et al.; “Copper electroless deposition technology for ultra-large-scale-integration (ULSI) metallization”, Microelectronic Engineering 33 (1997) pp. 47-58.
Shacham-Diamand, et al.; “High aspect ratio quarter-micron electroless copper integrated technology”, Microelectronic Engineering 37/38 (1997) pp. 77-88.
Shacham-Diamand, et al.; “Integrated electroless metallization for ULSl” , Electrochimica Acta 44 (1999) pp. 3639-3649.
Ting, et al.; “Selective Electroless Metal Deposition for Via Hole Filling in VLSI Multilevel Interconnection Structures”, J Electrochem. Soc., vol. 136, No. 2, Feb. 1989, The Electrochemical Society, Inc., pp. 462-466.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Pretreatment for electroless deposition does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Pretreatment for electroless deposition, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Pretreatment for electroless deposition will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3841494

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.