Plasma nitriding method, method for manufacturing...

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – By reaction with substrate

Reexamination Certificate

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C438S021000, C438S113000, C438S460000, C438S701000, C257SE21240, C257SE21223, C257SE21597

Reexamination Certificate

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07968470

ABSTRACT:
A nitriding process is performed at a process temperature of 500° C. or more by causing microwave-excited high-density plasma of a nitrogen-containing gas to act on silicon in the surface of a target object, inside a process container of a plasma processing apparatus. The plasma is generated by supplying microwaves into the process container from a planar antenna having a plurality of slots.

REFERENCES:
patent: 2002/0004277 (2002-01-01), Ahn et al.
patent: 2005/0106896 (2005-05-01), Fukuchi
patent: 1 432 023 (2004-06-01), None
patent: 2000-294550 (2000-10-01), None
patent: 2001 -274148 (2001-10-01), None
patent: 2003-115587 (2003-04-01), None
patent: 2003-133232 (2003-05-01), None
patent: 2003-168684 (2003-06-01), None
patent: 2004-193413 (2004-07-01), None
patent: 02/058130 (2002-07-01), None
Machine language translation of Japan, Publication No. 2004-193,413.

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