Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate
2007-12-04
2007-12-04
Britt, Cynthia (Department: 2117)
Error detection/correction and fault detection/recovery
Pulse or data error handling
Digital logic testing
Reexamination Certificate
active
10651874
ABSTRACT:
An integrated circuit, including: a multiplicity of macro-circuits, each macro-circuit having the same function; a fuse bank containing a multiplicity of fuses, the state of the fuses storing test data indicating at least which macro-circuits failed a test; and means for preventing utilization of failing macro-circuits during operation of the integrated circuit and a method generating a partial good integrated circuit, the method including: providing an integrated circuit have a multiplicity of macro-circuits arranged in one or more groups, each macro-circuit having the same function and a fuse bank containing fuses; testing each macro-circuit prior to a fuse programming operation; programming the fuses in the fuse bank in order to store data indicating at least which macro-circuits failed the testing step; and preventing utilization of each failing macro-circuit during operation of the integrated based on the data stored in the fuse bank.
REFERENCES:
patent: 5610867 (1997-03-01), DeBrosse et al.
patent: 6363020 (2002-03-01), Shubat et al.
patent: 6505324 (2003-01-01), Cowan et al.
patent: 6757204 (2004-06-01), Di Ronza et al.
patent: 6829181 (2004-12-01), Seitoh
Barnhart Carl F.
Farnsworth, III Leonard O.
Felske Michael Z.
Gillis Pamela S.
Lynch Benjamin P.
Britt Cynthia
Schmeiser Olsen & Watts
Steinberg William H.
Tabone, Jr. John J.
LandOfFree
Partial good integrated circuit and method of testing same does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Partial good integrated circuit and method of testing same, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Partial good integrated circuit and method of testing same will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3875862