Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate
2006-12-08
2009-12-08
Norton, Nadine (Department: 1792)
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
C252S079100, C438S706000, C438S723000, C438S633000, C257S049000, C430S270100, C528S030000, C528S043000
Reexamination Certificate
active
07629260
ABSTRACT:
Provided herein are hardmask compositions that include an organosilane polymer prepared by the reaction of one or more compounds of Formula (I)in-line-formulae description="In-line Formulae" end="lead"?Si(OR1)(OR2)(OR3)R4in-line-formulae description="In-line Formulae" end="tail"?wherein R1, R2and R3may each independently be alkyl acetoxy or oxime; and R4may be hydrogen, alkyl, aryl or arylalkyl; andwherein the organosilane polymer has a polydispersity in a range of about 1.1 to about 2.
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Kim Jong Seob
Kim Sang-Kyun
Lee Jin Kuk
Lim Sang Hak
Oh Chang Il
Angadi Maki
Cheil Industries Inc.
Myers Bigel & Sibley Sajovec, PA
Norton Nadine
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