4. Measuring and testing
  5. Testing by impact or shock
  6. Accelerated or decelerated specimen

Sang-Kyun Kim

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Apparatus and method for extracting object based on feature...

Image analysis – Color image processing – Image segmentation using color
Reexamination Certificate

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Filler for filling a gap and method for manufacturing...

Active solid-state devices (e.g. – transistors – solid-state diode – With means to control surface effects – Insulating coating
Reexamination Certificate

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Organosilane hardmask compositions and methods of producing...

Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Reexamination Certificate

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Vehicle side impact test apparatus

Measuring and testing – Testing by impact or shock – Accelerated or decelerated specimen
Reexamination Certificate

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Profile ID: LFUS-PAI-P-2535254

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