Opto-thermal annealing methods for forming metal gate and...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S199000, C257SE21632

Reexamination Certificate

active

08039331

ABSTRACT:
An opto-thermal annealing method for forming a field effect transistor uses a reflective metal gate so that electrical properties of the metal gate and also interface between the metal gate and a gate dielectric are not compromised when opto-thermal annealing a source/drain region adjacent the metal gate. Another opto-thermal annealing method may be used for simultaneously opto-thermally annealing: (1) a silicon layer and a silicide forming metal layer to form a fully silicided gate; and (2) a source/drain region to form an annealed source/drain region. An additional opto-thermal annealing method may use a thermal insulator layer in conjunction with a thermal absorber layer to selectively opto-thermally anneal a silicon layer and a silicide forming metal layer to form a fully silicide gate.

REFERENCES:
patent: 6043545 (2000-03-01), Tseng et al.
patent: 6150243 (2000-11-01), Wieczorek et al.
patent: 6475888 (2002-11-01), Sohn
patent: 6940087 (2005-09-01), Komoda et al.
patent: 7074655 (2006-07-01), Lochtefeld et al.
patent: 2002/0098689 (2002-07-01), Chong et al.
patent: 2007/0202640 (2007-08-01), Al-Bayati et al.
patent: 2007/0249131 (2007-10-01), Allen et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Opto-thermal annealing methods for forming metal gate and... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Opto-thermal annealing methods for forming metal gate and..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Opto-thermal annealing methods for forming metal gate and... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4258122

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.