4. Excavating

Cheng-Ju Hsieh

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On-chip design for monitor

Error detection/correction and fault detection/recovery – Pulse or data error handling – Digital logic testing
Reexamination Certificate

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Power source design for embedded memory

Static information storage and retrieval – Powering
Patent

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Test pattern generator

Excavating
Patent

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Profile ID: LFUS-PAI-P-798244

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