Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2011-03-29
2011-03-29
Kebede, Brook (Department: 2894)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C257SE21680
Reexamination Certificate
active
07915118
ABSTRACT:
A nonvolatile memory device may include a semiconductor substrate, a floating gate electrode on the semiconductor substrate that includes an acute-angled tip at an upper end, and a control gate electrode insulated from the floating gate electrode and facing at least a portion of the floating gate electrode, wherein an angle formed between the semiconductor substrate and an upper portion of a lateral surface of the floating gate electrode is smaller than an angle formed between the semiconductor substrate and a lower portion of the lateral surface of the floating gate electrode.
REFERENCES:
patent: 6153904 (2000-11-01), Yang
patent: 6200860 (2001-03-01), Chiang et al.
patent: 6495420 (2002-12-01), Tseng
patent: 6617638 (2003-09-01), Chiang et al.
patent: 6635922 (2003-10-01), Hsieh et al.
patent: 6759709 (2004-07-01), Shimizu
patent: 6872623 (2005-03-01), Chuang et al.
patent: 6921694 (2005-07-01), Chuang et al.
patent: 6943403 (2005-09-01), Park
patent: 7151295 (2006-12-01), Yaegashi et al.
patent: 1997-0060501 (1997-08-01), None
patent: 1997-0060502 (1997-08-01), None
patent: 10-2001-0028985 (2001-04-01), None
patent: 10-2004-0055172 (2004-06-01), None
patent: 10-2004-0069944 (2004-08-01), None
patent: 10-2005-0020042 (2005-03-01), None
patent: 10-2006-0029772 (2006-04-01), None
patent: 10-2006-0046069 (2006-05-01), None
Han Hyun-sug
Ju Sup-youl
Park Se-jong
Uom Jung-sup
Yang Bong-gil
Kebede Brook
Lee & Morse P.C.
Samsung Electronics Co,. Ltd.
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