Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2006-02-15
2009-12-22
Richards, N Drew (Department: 2895)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S216000, C438S240000, C438S257000, C438S259000, C438S266000, C257S314000, C257S315000, C257SE21209
Reexamination Certificate
active
07635628
ABSTRACT:
The nonvolatile memory device includes a semiconductor substrate on which a source, a drain, and a channel region are formed, a tunneling oxide film formed on the channel region, a floating gate formed of a transition metal oxide (TMO) on the tunneling oxide, a blocking oxide film formed on the floating gate, a gate electrode formed on the blocking oxide film.
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Korean Office Action (with English translation) dated Apr. 25, 2006.
Ahn Seung-Eon
Khang Yoon-ho
Lee Eun-hye
Lee Myoung-jae
Seo Sun-ae
Buchanan & Ingersoll & Rooney PC
Lee Kyoung
Richards N Drew
Samsung Electronics Co,. Ltd.
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