Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate
Reexamination Certificate
2008-05-13
2008-05-13
Smith, Zandra V. (Department: 2822)
Semiconductor device manufacturing: process
Making field effect device having pair of active regions...
Having insulated gate
C438S259000, C438S593000
Reexamination Certificate
active
07371638
ABSTRACT:
A non-volatile memory cell includes a semiconductor substrate having a fin-shaped active region extending therefrom. A tunnel dielectric layer is provided, which extends on opposing sidewalls and an upper surface of the fin-shaped active region. A floating gate electrode is provided on the tunnel dielectric layer. This floating gate electrode has at least a partial groove therein. An inter-gate dielectric layer is also provided. This inter-gate dielectric layer extends on the floating gate electrode and into the at least a partial groove. A control gate electrode is provided, which extends on the inter-gate dielectric layer and into the at least a partial groove.
REFERENCES:
patent: 6468862 (2002-10-01), Tseng
patent: 7005700 (2006-02-01), Lee
patent: 2002/0093073 (2002-07-01), Mori et al.
patent: 2003/0042531 (2003-03-01), Jong
patent: 2003/0151077 (2003-08-01), Mathew
patent: 2005/0205924 (2005-09-01), Yoon et al.
patent: 2005/0227435 (2005-10-01), Oh et al.
patent: 2005/0266638 (2005-12-01), Cho et al.
patent: 2005/0272192 (2005-12-01), Oh et al.
patent: 2002-118186 (2002-04-01), None
patent: 2003-204068 (2003-07-01), None
patent: 2003-224215 (2003-08-01), None
patent: 1998-025547 (1998-07-01), None
patent: 10-0199369 (1999-03-01), None
patent: 1020010003086 (2001-01-01), None
patent: 1020020059473 (2002-07-01), None
patent: 1020030087293 (2003-11-01), None
Cho Eun-suk
Kim Tae-Yong
Lee Choong-ho
Myers Bigel & Sibley & Sajovec
Samsung Electronics Co,. Ltd.
Smith Zandra V.
Thomas Toniae M
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