Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2004-12-22
2009-06-16
Parker, Kenneth A (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S315000, C257S316000, C257S296000, C257SE29129, C257SE27103, C365S185010, C365S185070, C365S185110
Reexamination Certificate
active
07547943
ABSTRACT:
A NAND-type non-volatile memory device includes a substrate and a device isolation layer disposed on the substrate to define an active region. First and second selection transistors are disposed in the active region, such that each of the first and second selection transistors has a recessed channel. A plurality of memory transistors is disposed in the active region between the first selection transistor and the second selection transistor.
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Cho Eun-Suk
Cho Myoung-Kwan
Kwon Wook-Hyun
Diaz José R
Myers Bigel & Sibley & Sajovec
Parker Kenneth A
Samsung Electronics Co,. Ltd.
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