Non-volatile memory device and manufacturing method thereof

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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C438S260000

Reexamination Certificate

active

06893922

ABSTRACT:
A non-volatile memory device and a manufacturing method thereof are disclosed. The non-volatile memory device includes a gate insulating film formed on a semiconductor substrate, a floating gate formed on the gate insulating film, a dielectric film comprising a (TaO)1−x(TiO)xN film on the floating gate, and a control gate formed on the dielectric film. Thus, large charge capacitance values can be obtained compared to a similarly sized device using an ONO or Ta2O5thin film dielectric while simultaneously simplifying the manufacturing process.

REFERENCES:
patent: 5753559 (1998-05-01), Yew et al.
patent: 6054733 (2000-04-01), Doan et al.
patent: 6204203 (2001-03-01), Narwankar et al.
patent: 6259130 (2001-07-01), Wu
patent: 6352865 (2002-03-01), Lee et al.
patent: 6396099 (2002-05-01), Joo et al.
patent: 6448128 (2002-09-01), Lee et al.

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