Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Electron beam imaging
Patent
1990-05-04
1991-10-29
Bowers, Jr., Charles L.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Electron beam imaging
430313, 430323, 430325, G03F 736
Patent
active
050616048
ABSTRACT:
A described photo-sensitive system and process is useful as negative single layer photoresists with high resolution, high contrast, high sensitivity, long shelf life, and insensitivity to ambient light and allows large flexibility in the choice of polymer to be used.
REFERENCES:
patent: 4307178 (1981-12-01), Kaplan et al.
patent: 4389482 (1983-06-01), Bargon et al.
patent: 4414059 (1983-11-01), Blum et al.
patent: 4458994 (1984-07-01), Jain et al.
patent: 4588801 (1986-05-01), Harrah et al.
patent: 4613398 (1986-09-01), Chiong et al.
patent: 4822451 (1989-04-01), Ouderkirk et al.
patent: 4824699 (1989-04-01), Woo et al.
patent: 4868006 (1989-09-01), Yorkgitis et al.
patent: 4879176 (1989-11-01), Ouderkirk et al.
Dunn Douglas S.
Ouderkirk Andrew J.
Baxter Janet C.
Bowers Jr. Charles L.
Griswold Gary L.
Kirn Walter N.
Litman Mark A.
LandOfFree
Negative crystalline photoresists for UV photoimaging does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Negative crystalline photoresists for UV photoimaging, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Negative crystalline photoresists for UV photoimaging will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1400093