Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-01-10
2009-06-30
Pham, Thanh V (Department: 2894)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S777000, C257SE29137, C257SE27100, C257SE29117, C257SE21372, C257SE21411
Reexamination Certificate
active
07554140
ABSTRACT:
Provided is a NAND-type nonvolatile memory device and method of forming the same. In the method, a plurality of cell layers are stacked on a semiconductor substrate. Seed contact holes for forming a semiconductor pattern included in a stacked cell are formed at regular distance. At this time, the seed contact holes are arranged such that a bit line plug or a source line pattern is disposed at a center between one pair of seed contact holes adjacent to each other.
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Cho Hoo-Sung
Cho Won-Seok
Jang Jae-Hoon
Jeong Jae-Hun
Jung Soon-Moon
Karimy Mohammad T
Myers Bigel Sibley & Sajovec P.A.
Pham Thanh V
Samsung Electronics Co,. Ltd.
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