Multi-step process for forming high-aspect-ratio holes for...

Semiconductor device manufacturing: process – Coating of substrate containing semiconductor region or of... – Multiple layers

Reexamination Certificate

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C438S042000, C438S053000, C257S619000, C257SE21520

Reexamination Certificate

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07923379

ABSTRACT:
A method of forming an integrated circuit structure includes forming an opening in a substrate, with the opening extending from a top surface of the substrate into the substrate. The opening is filled with a filling material until a top surface of the filling material is substantially level with the top surface of the substrate. A device is formed over the top surface of the substrate, wherein the device includes a storage opening adjoining the filling material. A backside of the substrate is grinded until the filling material is exposed. The filling material is removed from the channel until the storage opening of the device is exposed.

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Bellouard, Y., et al., “Fabrication of High-Aspect Ratio, Micro-Fluidic Channels and Tunnels Using Femtosecond Laser Pulses and Chemical Etching,” Optics Express, vol. 12, No. 10, May 17, 2004, pp. 2120-2129.

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