Multi-layer circuit having a via matrix interlayer connection an

Semiconductor device manufacturing: process – Coating with electrically or thermally conductive material – To form ohmic contact to semiconductive material

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438108, 438629, 438637, H01L 214763

Patent

active

061535087

ABSTRACT:
An interlayer connection for electrically connecting first and second conductive elements and reducing interlayer registration requirements is disclosed. The interlayer connection includes a first layer including a first electrically conductive element, a second layer including a second electrically conductive element, and a third layer disposed between the first layer and the second layer. The third layer includes an electrically insulative portion having a matrix of immediately adjacent vias therethrough. A selected plurality of immediately adjacent vias within the matrix are disposed between the first and the second electrically conductive elements and contain electrically conductive material forming a conductive path between the first and the second electrically conductive elements.

REFERENCES:
patent: 5227008 (1993-07-01), Klum et al.
patent: 5291062 (1994-03-01), Higgins, III
patent: 5355019 (1994-10-01), Fuchs
patent: 5463250 (1995-10-01), Nguyen et al.
patent: 5468681 (1995-11-01), Pasch
patent: 5528080 (1996-06-01), Goldstein

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