Microelectronic device having floating gate protective layer...

Semiconductor device manufacturing: process – Making field effect device having pair of active regions... – Having insulated gate

Reexamination Certificate

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Details

C365S182000

Reexamination Certificate

active

10853455

ABSTRACT:
A method of manufacturing a microelectronic device including forming a memory cell having a floating gate located over a substrate, a dielectric layer over the floating gate, and a control gate located over a portion of the dielectric layer, wherein a portion of the dielectric layer is laterally disposed from the control gate. A protective layer is formed over the control gate and the dielectric layer. A mask having an opaque portion over the dielectric layer portion and an opening over the control gate is provided, and the protective layer is patterned employing the mask.

REFERENCES:
patent: 5045488 (1991-09-01), Yeh
patent: 5196367 (1993-03-01), Lu et al.
patent: 5652161 (1997-07-01), Ahn
patent: 5824584 (1998-10-01), Chen et al.
patent: 6166409 (2000-12-01), Ratnam et al.
patent: 6284596 (2001-09-01), Sung et al.
patent: 6344386 (2002-02-01), Io
patent: 6395592 (2002-05-01), Wu
patent: 6420232 (2002-07-01), Wu
patent: 6552386 (2003-04-01), Wu
patent: 2002/0102793 (2002-08-01), Wu
patent: 2002/0145162 (2002-10-01), Kamada et al.
patent: 02002299477 (2002-10-01), None

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